Current Search: Rivero, Jose Fernando. (x)
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Title
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Thermal and stress analysis of heterojunction bipolar transistor.
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Creator
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Rivero, Jose Fernando., Florida Atlantic University, Tsai, Chi-Tay, College of Engineering and Computer Science, Department of Ocean and Mechanical Engineering
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Abstract/Description
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The objective of this work is to perform the current induce thermal stress analysis of heterojunction bipolar transistor and to determine the implications of the variation of the thermal shunt thickness. A thesis presented on multi-physics using finite element analysis, covering fluid, thermal and stress with fatigue life analysis of a microelectronic heterojunction bipolar transistor.
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Date Issued
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2001
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PURL
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http://purl.flvc.org/fcla/dt/12834
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Subject Headings
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Junction transistors, Thermal analysis
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Format
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Document (PDF)