You are here

Semiconductor laserbased instrumentation for ocean-optical studies: problems in design, testing and calibration

Download pdf | Full Screen View

Date Issued:
1986
Title: Semiconductor laserbased instrumentation for ocean-optical studies: problems in design, testing and calibration.
0 views
0 downloads
Name(s): Caimi, F. M., creator
Tusting, Robert F., creator
Harbor Branch Oceanographic Institute
Type of Resource: text
Genre: Article
Issuance: single unit
Date Issued: 1986
Publisher: Society of Photo-Optical Instrumentation Engineers [SPIE]
Extent: 13 p.
Physical Description: pdf
Language(s): English
Identifier: 3180380 (digitool), FADT3180380 (IID), fau:5909 (fedora)
Note(s): Modern electro-optical components and design approaches allow superior multi-angular scatterometers and highly accurate transmissometers to be fabricated. Various design approaches are discussed and their several aspects contrasted. Calibration procedures, tests methods, performance deficiencies, and correction methods are discussed theoretically and practically for a semiconductor-laser-based instrument.
One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. This manuscript is an author version and may be cited as: Caimi, F. M. & Tusting, T. F. (1986). Semiconductor laserbased instrumentation for ocean-optical studies: problems in design, testing and calibration. In L. H. J. F. Beckmann, Briers, J. D., Yoder, P. R., (Eds.), Contemporary optical instrument design, fabrication, and testing: April 17-18, 1986, Innsbruck, Austria. Proceedings of the SPIE, 656 (pp. 189-200). Bellingham, WA, USA.
Florida Atlantic University. Harbor Branch Oceanographic Institute contribution #502.
Subject(s): Electro-optics
Transmissometers--Design and construction
Semiconductor lasers
Persistent Link to This Record: http://purl.flvc.org/FCLA/DT/3180380
Restrictions on Access: ©1986 Society of Photo-Optical Instrumentation Engineers [SPIE]
Host Institution: FAU