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Output power stabilization of collimated, solid-state laser emissions as applied to high accuracy attenuance measurements

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Date Issued:
1984
Title: Output power stabilization of collimated, solid-state laser emissions as applied to high accuracy attenuance measurements.
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Name(s): Caimi, F. M., creator
Tusting, Robert F., creator
Kennedy, G., creator
Harbor Branch Oceanographic Institute
Type of Resource: text
Genre: Article
Issuance: single unit
Date Issued: 1984
Publisher: Society of Photo-Optical Instrumentation Engineers [SPIE]
Extent: 11 p.
Physical Description: pdf
Language(s): English
Identifier: 3180377 (digitool), FADT3180377 (IID), fau:5908 (fedora)
Note(s): Measurement of optical attenuance over long path-lengths and at relatively specific wavelengths, is facilitated by recent developments in laser-diode technology, compared to previous instrumentation methods. Substantial optical power may be coupled into low divergence optical beams and at higher power efficiency compared to other sources. Unfortunately, well-known characteristics of solid-state laser diodes predicate use of complicated bias and modulation stabilization methods to avoid both facet damage and operation below threshold over temperature extremes.
One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. This manuscript is an author version and may be cited as: Caimi, F. M., Tusting, R. F., & Kennedy, G. (1984). Output power stabilization of collimated, solid-state laser emissions as applied to high accuracy attenuance measurements. In E. L. Moore & O. G. Ramer (Eds.), Fiber optic and laser sensors III: August 20-23, 1985, San Diego, California. Proceedings of the SPIE, 566 (pp. 358-367). Bellingham, WA, USA.
Florida Atlantic University. Harbor Branch Oceanographic Institute contribution #465.
Subject(s): Lasers
Lasers and optical engineering
Persistent Link to This Record: http://purl.flvc.org/fcla/dt/3180377
Restrictions on Access: ©1984 Society of Photo-Optical Instrumentation Engineers [SPIE]
Host Institution: FAU