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Geometric properties of non-differentiable contours: concurrent spatial harmonic and fractal analyses

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Date Issued:
1985
Title: Geometric properties of non-differentiable contours: concurrent spatial harmonic and fractal analyses.
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Name(s): Caimi, F. M., creator
Schmalz, Mark S., creator
Harbor Branch Oceanographic Institute
Type of Resource: text
Genre: Article
Issuance: single unit
Date Issued: 1985
Publisher: Society of Photo-Optical Instrumentation Engineers [SPIE]
Extent: 10 p.
Physical Description: pdf
Language(s): English
Identifier: 3180376 (digitool), FADT3180376 (IID), fau:5907 (fedora)
Note(s): A method for two-dimensional pattern recognition, applicable to particle shape and size determination, is presented which employs fractal geometric analysis. Fractal contour transformation presents several advantages over spatial harmonic analysis. Coordinate transformation is evaluated with respect to its effect upon feature discrimination in polar-mapped multivariable contours. A variety of non-differentiable contours are analyzed. Results are presented in terms of correlation, signal-to-noise ration, and computational load.
One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. This manuscript is an author version and may be cited as: Caimi, F. M., & Schmalz, M. S. (1985). Geometric properties of non-differentiable contours: concurrent spatial harmonic and fractal analyses. In N. A. Chigier & G. W. Stewart (Eds.), Particle sizing and spray analysis, August 21, 1985, San Diego, California. Proceedings of the SPIE, 573 (pp. 21-29). Bellingham, WA, USA.
Florida Atlantic University. Harbor Branch Oceanographic Institute contribution #401.
Subject(s): Fractals
Pattern recognition
Spatial analysis
Fractal geometry
Persistent Link to This Record: http://purl.flvc.org/FCLA/DT/3180376
Restrictions on Access: ©1985 Society of Photo-Optical Instrumentation Engineers [SPIE]
Host Institution: FAU