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Solar cell degradation under ionizing radiation ambient

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Date Issued:
2010
Summary:
The efforts addressed in this thesis refer to assaying the degradations in modern solar cells used in space-borne and/or nuclear environment applications. This study is motivated to address the following: 1. Modeling degradations in Si pn-junction solar cells (devices-under-test or DUTs) under different ionizing radiation dosages 2. Preemptive and predictive testing to determine the aforesaid degradations that decide eventual reliability of the DUTs; and 3. Using electrical overstressing (EOS) to emulate the fluence of ionizing radiation dosage on the DUT. Relevant analytical methods, computational efforts and experimental studies are described. Forward/reverse characteristics as well as ac impedance performance of a set of DUTs under pre- and post- electrical overstressings are evaluated. Change in observed DUT characteristics are correlated to equivalent ionizing-radiation dosages. The results are compiled and cause-effect considerations are discussed. Conclusions are enumerated and inferences are made with direction for future studies.
Title: Solar cell degradation under ionizing radiation ambient: preemptive testing and evaluation via electrical overstressing.
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Name(s): Thengum Pallil, George A.
College of Engineering and Computer Science
Department of Computer and Electrical Engineering and Computer Science
Type of Resource: text
Genre: Electronic Thesis Or Dissertation
Date Issued: 2010
Publisher: Florida Atlantic University
Physical Form: electronic
Extent: x, 80 p. : ill. (some col.)
Language(s): English
Summary: The efforts addressed in this thesis refer to assaying the degradations in modern solar cells used in space-borne and/or nuclear environment applications. This study is motivated to address the following: 1. Modeling degradations in Si pn-junction solar cells (devices-under-test or DUTs) under different ionizing radiation dosages 2. Preemptive and predictive testing to determine the aforesaid degradations that decide eventual reliability of the DUTs; and 3. Using electrical overstressing (EOS) to emulate the fluence of ionizing radiation dosage on the DUT. Relevant analytical methods, computational efforts and experimental studies are described. Forward/reverse characteristics as well as ac impedance performance of a set of DUTs under pre- and post- electrical overstressings are evaluated. Change in observed DUT characteristics are correlated to equivalent ionizing-radiation dosages. The results are compiled and cause-effect considerations are discussed. Conclusions are enumerated and inferences are made with direction for future studies.
Identifier: 705370796 (oclc), 2979384 (digitool), FADT2979384 (IID), fau:3606 (fedora)
Note(s): by George A. Thengum Pallil.
Thesis (M.S.C.S.)--Florida Atlantic University, 2010.
Includes bibliography.
Electronic reproduction. Boca Raton, Fla., 2010. Mode of access: World Wide Web.
Subject(s): Renewable energy sources
Solar cells -- Effect of radiation on
Reliability (Engineering)
Electric discharges
Ionizing radiation
Persistent Link to This Record: http://purl.flvc.org/FAU/2979384
Use and Reproduction: http://rightsstatements.org/vocab/InC/1.0/
Host Institution: FAU