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DCVS logic synthesis
- Date Issued:
- 1992
- Summary:
- Implementation of CMOS combinational logic with Differential Cascode Voltage Switch logic (DCVS) may have many advantages over the traditional CMOS logic approaches with respect to device count, layout density and timing. DCVS is an ideal target technology for a logic synthesis system in that it provides a complete function cover by providing the function and its complement simultaneously. DCVS is also more testable due to this. We have developed for IBM's DCVS technology a synthesis algorithm and a new test generation approach, that are based on topologies rather than individual logic functions. We have found that 19 and 363 DCVS topologies can represent 256 and 65,536 functions, respectively, for the 3- and 4-varaible cases. Physical defect analysis was conducted with the aid of a building block approach to analyze the n-type logic tree and provides a basis for evolving hierarchical test pattern generation for the topologies.
Title: | DCVS logic synthesis. |
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Name(s): |
Xiao, Kang. Florida Atlantic University, Degree grantor Barrett, Raymond L. Jr., Thesis advisor College of Engineering and Computer Science Department of Computer and Electrical Engineering and Computer Science |
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Type of Resource: | text | |
Genre: | Electronic Thesis Or Dissertation | |
Issuance: | monographic | |
Date Issued: | 1992 | |
Publisher: | Florida Atlantic University | |
Place of Publication: | Boca Raton, Fla. | |
Physical Form: | application/pdf | |
Extent: | 117 p. | |
Language(s): | English | |
Summary: | Implementation of CMOS combinational logic with Differential Cascode Voltage Switch logic (DCVS) may have many advantages over the traditional CMOS logic approaches with respect to device count, layout density and timing. DCVS is an ideal target technology for a logic synthesis system in that it provides a complete function cover by providing the function and its complement simultaneously. DCVS is also more testable due to this. We have developed for IBM's DCVS technology a synthesis algorithm and a new test generation approach, that are based on topologies rather than individual logic functions. We have found that 19 and 363 DCVS topologies can represent 256 and 65,536 functions, respectively, for the 3- and 4-varaible cases. Physical defect analysis was conducted with the aid of a building block approach to analyze the n-type logic tree and provides a basis for evolving hierarchical test pattern generation for the topologies. | |
Identifier: | 14850 (digitool), FADT14850 (IID), fau:11637 (fedora) | |
Collection: | FAU Electronic Theses and Dissertations Collection | |
Note(s): |
College of Engineering and Computer Science Thesis (M.S.C.E.)--Florida Atlantic University, 1992. |
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Subject(s): |
Integrated circuits--Very large scale integration--Data processing Metal oxide semiconductors, Complementary Computer-aided design Electronic systems Logic design--Data processing |
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Held by: | Florida Atlantic University Libraries | |
Persistent Link to This Record: | http://purl.flvc.org/fcla/dt/14850 | |
Sublocation: | Digital Library | |
Use and Reproduction: | Copyright © is held by the author, with permission granted to Florida Atlantic University to digitize, archive and distribute this item for non-profit research and educational purposes. Any reuse of this item in excess of fair use or other copyright exemptions requires permission of the copyright holder. | |
Use and Reproduction: | http://rightsstatements.org/vocab/InC/1.0/ | |
Host Institution: | FAU | |
Is Part of Series: | Florida Atlantic University Digital Library Collections. |