You are here
Low-level and high-level correlation for image registration
- Date Issued:
- 1990
- Summary:
- The fundamental goal of a machine vision system in the inspection of an assembled printed circuit board is to locate the integrated circuit(IC) components. These components are then checked for their position and orientation with respect to a given position and orientation of the model and to detect deviations. To this end, a method based on a modified two-level correlation scheme is presented in this thesis. In the first level, Low-Level correlation, a modified two-stage template matching method is proposed. It makes use of the random search techniques, better known as the Monte Carlo method, to speed up the matching process on binarized version of the images. Due to the random search techniques, there is uncertainty involved in the location where the matches are found. In the second level, High-Level correlation, an evidence scheme based on the Dempster-Shafer formalism is presented to resolve the uncertainty. Experiment results performed on a printed circuit board containing mounted integrated components is also presented to demonstrate the validity of the techniques.
Title: | Low-level and high-level correlation for image registration. |
72 views
23 downloads |
---|---|---|
Name(s): |
Mandalia, Anil Dhirajlal. Florida Atlantic University, Degree grantor Sudhakar, Raghavan, Thesis advisor College of Engineering and Computer Science Department of Computer and Electrical Engineering and Computer Science |
|
Type of Resource: | text | |
Genre: | Electronic Thesis Or Dissertation | |
Issuance: | monographic | |
Date Issued: | 1990 | |
Publisher: | Florida Atlantic University | |
Place of Publication: | Boca Raton, Fla. | |
Physical Form: | application/pdf | |
Extent: | 107 p. | |
Language(s): | English | |
Summary: | The fundamental goal of a machine vision system in the inspection of an assembled printed circuit board is to locate the integrated circuit(IC) components. These components are then checked for their position and orientation with respect to a given position and orientation of the model and to detect deviations. To this end, a method based on a modified two-level correlation scheme is presented in this thesis. In the first level, Low-Level correlation, a modified two-stage template matching method is proposed. It makes use of the random search techniques, better known as the Monte Carlo method, to speed up the matching process on binarized version of the images. Due to the random search techniques, there is uncertainty involved in the location where the matches are found. In the second level, High-Level correlation, an evidence scheme based on the Dempster-Shafer formalism is presented to resolve the uncertainty. Experiment results performed on a printed circuit board containing mounted integrated components is also presented to demonstrate the validity of the techniques. | |
Identifier: | AAI1341179 (UnM), 14635 (digitool), FADT14635 (IID) | |
Collection: | FAU Electronic Theses and Dissertations Collection | |
Note(s): |
College of Engineering and Computer Science Thesis (M.S.E.)--Florida Atlantic University, 1990. |
|
Subject(s): |
Image processing--Digital techniques Computer vision Integrated circuits |
|
Held by: | Florida Atlantic University Libraries | |
Persistent Link to This Record: | http://purl.flvc.org/fcla/dt/14635 | |
Sublocation: | Digital Library | |
Use and Reproduction: | Copyright © is held by the author, with permission granted to Florida Atlantic University to digitize, archive and distribute this item for non-profit research and educational purposes. Any reuse of this item in excess of fair use or other copyright exemptions requires permission of the copyright holder. | |
Use and Reproduction: | http://rightsstatements.org/vocab/InC/1.0/ | |
Host Institution: | FAU | |
Is Part of Series: | Florida Atlantic University Digital Library Collections. |